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880367

Part Number	880367
Manufacturer	TriQuint Semiconductor
Description	1030 MHz SSR/IFF BAW Filter
Published	Jun 26, 2012
Detailed Description	880367 1030 MHz IFF BAW Filter Applications • • For SSR/IFF Applications For high-selectivity applications Product Feat...
Datasheet	880367 PDF File

Overview

880367 1030 MHz IFF BAW Filter Applications • • For SSR/IFF Applications For high-selectivity applications Product Features • • • • • • • Usable bandwidth 14.
5 MHz Low loss High selectivity Single-ended operation Ceramic chip-scale Package (CSP) Small Size Hermetic RoHS compliant, Pb-free Functional Block Diagram I/O I/O GND Pin Configuration www.
DataSheet.
net/ Overall width, length, and thickness are the only critical dimensions.
All other dimensions are for reference only.
Dimensions shown are nominal in millimeters All tolerances are ±0.
13mm except overall length and width ±0.
25mm Body: Sapphire Package: Alumina Terminations: Au plating 0.
5 - 2.
5µ m, over a 2.
0 – 6.
0 µm Ni plating Pin # SE-Balanced I/O GND Description Input/Output Ground 0.
84 NOM.
0.
89 MAX.
Ordering Information 3.
71 Part No.
880367 880367 Eval Board Description packaged part evaluation board 2.
57 0.
51 0.
58 0.
075 TYP.
0.
50 0.
45 0.
98 0.
51 0.
075 TYP.
Data Sheet: Rev - 8/1/2011 © 2011 TriQuint Semiconductor, Inc.
- 1 of 6 - Disclaimer: Subject to change without notice Connecting the Digital World to the Global Network Datasheet pdf - http://www.
DataSheet4U.
co.
kr/ 880367 1030 MHz IFF BAW Filter Specifications Electrical Specifications (1) Specified Temperature Range: (2) -40 to +85 ºC Parameter (3) Center Frequency Maximum Insertion Loss 3dB Bandwidth 40dB Lower Frequency Edge 40dB Upper Frequency Edge VSWR Source Impedance (single-ended) (5) Load Impedance (single-ended) (5) Conditions @ 1030 MHz Reference loss at 1030 MHz Min 14 1009 - Typical (4) 1030 3.
0 20 1013 1051 1.
7 50 50 Max 4.
0 1046 2.
0 - Units MHz dB MHz MHz MHz Ω Ω @ 1030 MHz Notes: 1.
All specifications are based on the TriQuint schematic for the main reference design shown on page 3 2.
In production, devices will be tested at room temperature to a guardbanded specification to ensure electrical compliance over temperature 3.
Electrical margin has been built into the design to account for the variations due...

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