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880157

TriQuint Semiconductor
Part Number 880157
Manufacturer TriQuint Semiconductor
Description 2560 MHz S-Band BAW Filter
Published Jun 26, 2012
Detailed Description 880157 2560 MHz BAW Filter Applications   S-Band For high-selectivity applications Product Features        Usa...
Datasheet PDF File 880157 PDF File

880157
880157


Overview
880157 2560 MHz BAW Filter Applications   S-Band For high-selectivity applications Product Features        Usable bandwidth 30 MHz Low loss High selectivity Single-ended operation Ceramic chip-scale Package (CSP) Small Size Hermetic RoHS compliant, Pb-free Functional Block Diagram I/O I/O GND Pin Configuration www.
DataSheet.
net/ Overall width, length, and thickness are the only critical dimensions.
All other dimensions are for reference only.
Dimensions shown are nominal in millimeters All tolerances are 0.
13mm except overall length and width 0.
25mm Body: Sapphire Package: Alumina Terminations: Au plating 0.
5 - 2.
5 m, over a 2.
0 – 6.
0  m Ni plating Pin # SE-Balanced I/O GND Description Input/Output Ground Ordering Information Part No.
880157 880157 Eval Board 0.
84 NOM.
0.
89 MAX.
Description packaged part evaluation board 2.
57 0.
51 3.
71 0.
58 0.
075 TYP.
0.
50 0.
45 0.
98 0.
51 0.
075 TYP.
Data Sheet: Rev B 12/2011 © 2011 TriQuint Semiconductor, Inc.
- 1 of 6 - Disclaimer: Subject to change without notice e Connecting the Digital World to the Global Network ® Datasheet pdf - http://www.
DataSheet4U.
co.
kr/ 880157 2560 MHz BAW Filter Specifications Electrical Specifications (1) Specified Temperature Range: (2) -40 to +85 ºC Parameter (3) Center Frequency Maximum Insertion Loss 3dB Bandwidth 40dB Lower Frequency Edge 40dB Upper Frequency Edge VSWR Source Impedance (single-ended) (5) Load Impedance (single-ended) (5) Conditions @ 2560 MHz Reference loss at 2560 MHz Min 30 2505 - Typical (4) 2560 3.
8 38 2525 2595 1.
5 50 50 Max 4.
5 2610 2.
0 - Units MHz dB MHz MHz MHz   @ 2560 MHz Notes: 1.
All specifications are based on the TriQuint schematic for the main reference design shown on page 3 2.
In production, devices will be tested at room temperature to a guardbanded specification to ensure electrical compliance over temperature 3.
Electrical margin has been built into the design to account for the variations due to temperature drift an...


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