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AD5660 Datasheet

12-/14-/16-Bit nanoDAC

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AD5660 pdf
AD5620/AD5640/AD5660
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy, or integral nonlinearity (INL), is
a measurement of the maximum deviation, in LSBs, from a
straight line passing through the endpoints of the DAC transfer
function. Figure 6 through Figure 8 show typical INL vs. code.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. Figure 9 through Figure 11 show typical DNL vs. code.
Zero-Code Error
Zero-code error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5620/AD5640/AD5660, because the output of the DAC
cannot go below 0 V. It is due to a combination of the offset
errors in the DAC and the output amplifier. Zero-code error is
expressed in mV. Figure 20 shows a plot of zero-code error vs.
temperature.
Full-Scale Error
Full-scale error is a measurement of the output error when full-
scale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be VDD − 1 LSB. Full-scale error is expressed as a
percentage of the full-scale range. Figure 19 shows a plot of full-
scale error vs. temperature.
Gain Error
This is a measurement of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range.
Zero-Code Error Drift
This is a measurement of the change in zero-code error with a
change in temperature. It is expressed in µV/°C.
Gain Temperature Coefficient
This is a measurement of the change in gain error with changes
in temperature. It is expressed in (ppm of full-scale range)/°C.
Data Sheet
Offset Error
Offset error is a measurement of the difference between VOUT
(actual) and VOUT (ideal) expressed in mV in the linear region of
the transfer function. Offset error is measured on the AD5660
with Code 512 loaded into the DAC register. It can be negative
or positive.
DC Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in VOUT to
the change in VDD for the full-scale output of the DAC. It is
measured in dB. VREF is held at 2.5 V, and VDD is varied by ±10%.
Output Voltage Settling Time
This indicates the amount of time for the output of a DAC to
settle to a specified level for a ¼ to ¾ full-scale input change. It
is measured from the 24th falling edge of SCLK.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000). See
Figure 32 and Figure 33.
Digital Feedthrough
Digital feedthrough is a measurement of the impulse injected
into the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s or vice versa.
Noise Spectral Density
This is a measurement of the internally generated random
noise. Random noise is characterized as a spectral density
(voltage per √Hz). It is measured by loading the DAC to
midscale and measuring noise at the output. It is measured
in nV/√Hz. Figure 38 shows a plot of noise spectral density.
Rev. G | Page 16 of 28
Analog Devices
Analog Devices


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