Output Voltage Setting Time
Reference Multiplying BW
DAC Glitch Impulse
Total Harmonic Distortion
Output Spot Noise Voltage
To ±0.1% full scale, data = zero scale to
full scale to zero scale
VREF = 100 mV rms, data = full scale, C1 = 5.6 pF
VREF = 0 V, data = midscale minus 1 to midscale
Data = zero scale, VREF = 100 mV rms,
f = 1 kHz, same channel
CS = logic high and fCLK = 1 MHz
VREF = 5 V p-p, data = full scale, f = 1 kHz to 10 kHz
VREFB = 0 V, measure VOUTB with VREFA = 5 V p-p
sine wave, data = full scale, f = 1 kHz to 10 kHz
f = 1 kHz, BW = 1 Hz
Min Typ Max Unit
1 All static performance tests (except IOUT) are performed in a closed-loop system using an external precision OP1177 I-to-V converter amplifier. The AD5545 RFB terminal
is tied to the amplifier output. Typical values represent average readings measured at 25°C.
2 These parameters are guaranteed by design and not subject to production testing.
3 All ac characteristic tests are performed in a closed-loop system using an AD8038 I-to-V converter amplifier and the AD8065 for the THD specification.
4 All input control signals are specified with tR = tF = 2.5 ns (10% to 90% of 3 V) and timed from a voltage level of 1.5 V.
SDI A1 A0 D15 D14 D13 D12 D11 D10
Figure 2. AD5545 18-Bit Data Word Timing Diagram
INPUT REG LD
A1 A0 D13 D12 D11 D10 D09 D08
Figure 3. AD5555 16-Bit Data Word Timing Diagram
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INPUT REG LD