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AD5160 Datasheet
256-Position SPI-Compatible Digital Potentiometer
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AD5160 pdf
AD5160
Data Sheet
TEST CIRCUITS
Figure 28 to Figure 36 illustrate the test circuits that define the test conditions used in the product specification tables.
5V
DUT
A
V+ W
B
V+ = VDD
1LSB = V+/2N
VMS
OFFSET
GND
OP279
VIN
W
A DUT
OFFSET
BIAS
B
VOUT
Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
Figure 33. Test Circuit for Noninverting Gain
NO CONNECT
DUT
A
W
B
IW
VMS
Figure 29. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
VMS2
DUT
A
W
B
IW = VDD / RNOMINAL
VW
VMS1 RW = [VMS1 – VMS2]/ IW
Figure 30. Test Circuit for Wiper Resistance
VA
VDD A
V+ W
B
( )V+= VDD 10%
PSRR (dB) = 20 LOG
V MS
V DD
PSS (%/%) = VMS%
V DD%
VMS
Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
A
VIN DUT
OFFSET
GND
2.5V
B
W
+15V
AD8610
–15V
VOUT
Figure 34. Test Circuit for Gain vs. Frequency
DUT
W
B
RSW =
0.1V
ISW
CODE = 0x00
ISW 0.1V
VSS TO VDD
Figure 35. Test Circuit for Incremental On Resistance
NC
VDD DUT
VSS GND
A
W
B
ICM
VCM
NC NC = NO CONNECT
Figure 36. Test Circuit for Common-Mode Leakage Current
OFFSET
GND
A DUT B
VIN W
OFFSET
BIAS
5V
OP279
VOUT
Figure 32. Test Circuit for Inverting Gain
Rev. C | Page 12 of 16

AD5160 Datasheet PDF



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